Introduction to SSD Product Testing
With in-house R&D capabilities, MCPi provides one-stop SSD burn-in and testing services, from R&D validation to volume production. Our services cover PCIe Gen5/Gen6 and CXL ultra-high-speed interface protocol compatibility; continuous read/write testing and dirty drive performance recovery; microsecond-level high-speed write abnormal power loss protection (PLP) testing; as well as reliability demonstration testing (RDT) in wide temperature environments (-40°C to 85°C) for commercial, industrial, and automotive specifications.
Through tens of hours of high-temperature read/write operations, we screen out early-life failures.
MCPi offers one-stop SSD testing from R&D validation to volume production. Our testing covers PCIe Gen5/Gen6 protocol compatibility, read/write performance stress, microsecond-level abnormal power loss protection (PLP), and industrial/automotive wide temperature reliability demonstration testing (RDT). Furthermore, relying on our strength in aluminum 6061 micron-level machining, ESD POM anti-static properties, and ±2°C thermal field uniform temperature fixtures, we comprehensively overcome high-temperature hot-swapping and noise bottlenecks to create a highly reliable process.
MCPi offers one-stop supply chain integration, from backplane design to precision machining. The production line adopts a high-density layered mechanism configuration, maximizing slot positions to meet large-scale production capacity. The process effectively blocks high-frequency noise to ensure data accuracy. Paired with an open system architecture, it can flexibly connect with customer-specified bad block management and high-performance burning products.
Choosing MCPi offers four major advantages: independent software and hardware R&D, enabling rapid customization of exclusive automated testing machines; fixtures feature aluminum 6061 micron-level machining with tolerances ≤0.01mm, solving the pain point of jamming during high-temperature hot-swapping; strict selection of ESD POM anti-static materials paired with a ±2°C thermal field uniform temperature design to eliminate misjudgments; comprehensively covering high-specification processes including PCIe Gen5, PLP power loss, and industrial/automotive wide temperature reliability demonstration testing (RDT). We are a powerful backing that combines testing and equipment R&D.